9780387400921. New condition. Hard cover. 2nd 2004 ed. Language: English. Pages: 408. Sewn binding. Cloth over boards. 408 p. Contains: Unspecified, Illustrations, black & white, Figures. Advanced Texts in Physics. The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists.
| General Specification | Single Book |
| Language | English |
| SKU | sd260708171128388154483 |
Your payment at SHEIN is secured with global payment security certifications.
SHEIN does not share personal information about you with nonaffiliated third parties. All your information and privacy will not be compromised.